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Volumn 46, Issue 24, 2001, Pages 2046-2048
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The PL "violet shift" of cerium dioxide on silicon
a a a a a a |
Author keywords
Cerium dioxide thin film; PL violet shift
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Indexed keywords
CERIUM;
OXIDE;
SILICON;
ANALYTIC METHOD;
ARTICLE;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
ELECTRIC FIELD;
ELLIPSOMETRY;
FILM;
TEMPERATURE;
X RAY DIFFRACTION;
VIOLA (ANGIOSPERM);
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EID: 0035670760
PISSN: 10016538
EISSN: None
Source Type: Journal
DOI: 10.1007/bf02901128 Document Type: Article |
Times cited : (9)
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References (17)
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