SCOPUS 정보 검색 플랫폼

Semiconductor Science and Technology

Volumn 16, Issue 12, 2001, Pages 1002-1007

Evaluation of semi-insulating Ti-doped and Mn-doped InP for radiation detection

(3) Zdansky K a Pekarek L b Kacerovsky P a

a INSTITUTE OF PHOTONICS AND ELECTRONICS (Czech Republic)

b INSTITUTE OF PHYSICS (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CRYSTAL GROWTH FROM MELT; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRON TRAPS; HALL EFFECT; IRON; LOW TEMPERATURE EFFECTS; MANGANESE; SEMICONDUCTOR DOPING; TITANIUM; ZINC;

HALL EFFECT MEASUREMENTS; RADIATION DETECTION;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0035657385 PISSN: 02681242 EISSN: None Source Type: Journal
DOI: 10.1088/0268-1242/16/12/310 Document Type: Article

Times cited : (11)

References (24)

1
- 0020113959
- (1983) IEEE Electron Devices , vol.30 ED , pp. 412
- Hammond, R.B.¹ Paultner, N.G.² Wagner, R.S.³ Springer, T.E.⁴ MacRoberts, M.D.J.⁵

2
- 0021391993
- (1984) Appl. Phys. Lett. , vol.44 , pp. 620
- Hammond, R.B.¹ Paultner, N.G.² Wagner, R.S.³ Springer, T.E.⁴

3
- 0020753730
- (1984) Nucl. Instrum. Methods A , vol.222 , pp. 270
- Kania, D.R.¹ Bartlett, R.J.² Wagner, R.S.³ Hammond, R.B.⁴

4
- 0024106279
- (1988) Nucl. Instrum. Methods A , vol.272 , pp. 885
- Lund, J.C.¹ Olschner, F.² Sinclair, F.³ Squillante, M.R.⁴

5
- 0030129453
- (1996) Nucl. Instrum. Methods A , vol.373 , pp. 47
- Valentini, A.¹ Cola, A.² Maggi, G.³ Paticchio, V.⁴ Quaranta, F.⁵ Vasanelli, L.⁶

6
- 0004236139
- (Amsterdam: North-Holland)
- (1968) Semiconductor Detectors , pp. 474
- Bertolini, G.¹ Coche, A.²

7
- 0027274579
- (1993) Proc. 5th Int. Conf. on InP and Related Materials (Paris) , pp. 99
- Scheffler, H.¹ Baber, N.² Dadgar, A.³ Wolf, T.⁴ Bimberg, D.⁵

8
- 0000715014
- (1997) Phys. Rev. B , vol.56 , pp. 10241
- Dadgar, A.¹ Engelhardt, R.² Kuttler, M.³ Bimberg, D.⁴

9
- 0001855498
- (1999) J. Electr. Eng. , vol.50 , pp. 20
- Prochazkova, O.¹ Zavadil, J.² Zdansky, K.³ Novotny, J.⁴ Perina, V.⁵

10
- 0000666090
- (1990) J. Appl. Phys. , vol.67 , pp. 6882
- Huang, K.¹ Wessels, B.W.²

11
- 0343568574
- ed R B James, T E Schlesinger, P Siffert and W Dusi (Warrendale PA USA: Mater. Res. Soc.)
- (1997) Semiconductors for Room-Temperature Radiation Detector Applications: II. Symposium (Boston) , pp. 477
- Pelfer, P.G.¹ Dubecky, F.² Fornari, R.³ Pikna, M.⁴

12
- 0007435340
- (2000) Third Int. EuroConf. on Advanced Semiconductor Devices and Microsystems ASDAM 2000 (Smolenice Slovakia) , pp. 429
- Zatko, B.¹ Dubecky, F.² Darmo, J.³ Euthimiou, P.⁴ Necas, V.⁵ Krempasky, M.⁶

13
- 84990713766
- (1993) Phys. Status Solidi a , vol.135
- Betko, J.¹ Merinsky, K.²

14
- 0033872275
- (2000) J. Cryst. Growth , vol.211 , pp. 179
- Zhao, Y.W.¹ Fung, S.² Beling, C.D.³ Sun, N.F.⁴ Chen, X.D.⁵ Sun, T.N.⁶ Zhang, J.⁷ Bi, K.⁸ Wu, X.⁹

15
- 36448999763
- (1991) Appl. Phys. Lett. , vol.59 , pp. 446
- Shi, Z.Q.¹ Wallace, R.L.² Anderson, W.A.³

16
- 0013337937
- (1992) 4th Int. Conf. on InP and Related Materials (Newport Ri USA) , pp. 638
- Zach, F.X.¹ Bourret, E.D.² Bliss, D.³ Weber, E.R.⁴ Haller, E.E.⁵

17
- 0018785147
- (1979) Electron. Lett. , vol.15 , pp. 753
- Bhattacharya, P.K.¹ Ku, J.W.² Owen, S.J.T.³ Chiao, S.H.⁴ Yeats, R.⁵

18
- 0343427448
- (Bristol: Institute of Physics)
- (1979) Gallium Arsenide and Related Compounds (St Louis, 1978) (Inst. Phys. Conf. Ser. 45) , pp. 144
- Iseler, G.W.¹

19
- 0019875027
- (1981) Electron. Lett. , vol.17 , pp. 55
- Bremond, G.¹ Nouailhat, A.² Guillot, G.³ Cockyane, B.⁴

20
- 0007429264
- (2000) Semicond. Sci. Technol. , vol.15 , pp. 397
- Zdansky, K.¹ Pekarek, L.² Kacerovsky, P.³

21
- 0022722145
- (1987) J. Cryst. Growth , vol.83 , pp. 184
- Toudic, Y.¹ Coquille, R.² Gauneau, M.³ Grandpierre, G.⁴ Le Marechal, L.⁵ Lambert, B.⁶

22
- 36549104944
- (1986) Appl. Phys. Lett. , vol.48 , pp. 1656
- Iseler, G.W.¹ Ahern, B.S.²

23
- 0007386589
- ed W Zawadski (Warsaw: Polish Academy of Science)
- (1989) Proc. 19th Int. Conf. on Physics of Semiconductors , pp. 1095
- Wasik, D.¹ Baj, M.² Hennel, A.M.³

24
- 0021818958
- ed L C Kimerling and J M Parsey Jr (Warrendale, PA, USAM: Metallurg. Soc. AIME)
- (1985) Proc. 13th Int. Conf. on Defects in Semicond. (Coronado CA USA) , pp. 1141
- Lambert, B.¹ Clerjaud, B.² Naud, C.³ Deveaud, B.⁴ Picoli, G.⁵ Toudic, Y.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.