Electronic properties of chemically produced silver clusters: Electron trapping or hole removing?

Imaging Science Journal

Volumn 49, Issue 4, 2001, Pages 189-196

  Hailstone, R K ^a  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Electron trapping; Electronic properties; Photoconductivity; Photogenerated holes; Sensitometry; Silver clusters

Indexed keywords

EID: 0035647875     PISSN: 13682199     EISSN: None     Source Type: Journal    
DOI: 10.1080/13682199.2001.11784382     Document Type: Article

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