Formation and spectroscopic manifestation of silver clusters on silver bromide surfaces

Journal of Physical Chemistry B

Volumn 102, Issue 27, 1998, Pages 5287-5297

  Marchetti, A P ^a   Muenter, A A ^a   Baetzold, R C ^a   McCleary, R T ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000593114     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp980729i     Document Type: Article

References (56)

1. Tani, T. Photographic Sensitivity; Oxford University Press: Oxford, 1995; Chapter 4 and references therein.
2. Harbison, J. M.; Spencer, H. E. In The Theory of the Photographic Process, 4th ed.; James, T. H., Ed.; Macmillan: New York, 1977; pp 151-152.
3. Tani, T. Photogr. Sci. Eng. 1974, 18, 569.
4. Hamilton, J. F.; Baetzold, R. C. Photogr. Sci. Eng. 1981, 25, 189.
5. Hamilton, J. F. Adv. Phys. 1988, 37, 359.
6. See: Hailstone, R. K.; Liebert, N. B.; Levy, M.; McCleary, R. T.; Girolmo, S. R.; Jeanmaire, D. L.; Boda, C. R. J. Imaging Sci. 1988, 32, 113 and references therein.
7. Hailstone, R. K.; Liebert, N. B.; Levy, M.; Hamilton, J. F. Unpublished results, 1990.
8. Tani, T. Photogr. Sci. Eng. 1974, 18, 569.
9. Collier, S. Photogr. Sci. Eng. 1979, 23, 113.
10. Starbova, K. Photogr. Sci. Eng. 1984, 28, 245.
11. Tani, T. Photographic Sensitivity; Oxford University Press: Oxford, 1995; Chapter 6 Section 4.
12. Kellog, L. M.; Liebert, N. B.; James, T. H. Photogr. Sci. Eng. 1972, 16, 115.
13. Kanzaki, H.; Tadakuma, Y. J. Phys. Chem. Solids 1994, 55, 631.
14. Codling, A. J. B. Photogr. Sci. Eng. 1975, 19, 44.
15. Guo, S.; Hailstone, R. K. J. Imaging Sci. Tech. 1996, 40, 210.
16. Costa, F.; Janusonis, G. A.; Merrigan, J. A. Photogr. Sci. Eng. 1978, 22, 301.
17. Olm, M. T. Private communication.
18. James, T. H.; Vanselow, W.; Quirk, R. F. PSA J., 1948, 14, 349.
19. Berry, C. R. In The Theory of the Photographic Process: James, T. H., Ed. Macmillan: New York, 1977; Chapter 3; U.S. Patent Number 5,147,771 Sept 15, 1992; U.S. Patent Number 5,210,013, May 11, 1993.
20. James, T. H.; Vanselow, W.; Quirk, R. F. Photogr. Sci. Technol. 1953, 19B, 170.
21. Marchetti, A. P.; Johannsson, K. P.; McLendon, G. L. Phys. Rev. B 1993, 47, 4268.
22. Marchetti, A. P.; Burberry, M. S.; Spoonhower, J. P. Phys. Rev. B 1991, 43, 2378.
23. Czaja, W.; Baldereschi, A. J. Phys. C 1979, 12, 405.
24. Marchetti, A. P.; Burberry, M. S. Phys. Rev. B 1988, 37, 10862.
25. Burki, Y.; Czaja, W. Europhys. Lett. 1989, 10, 55.
26. Burberry, M. S. Marchetti, A. P. Phys. Rev. B 1985, 32, 1192.
27. Moser, F.; Lyu, S. J. Luminescence, 1971, 3, 447.
28. Tani, T. Photogr. Sci. Eng. 1971, 15, 181.
29. Babcock, T. A.; Ferguson, P. M.; Lewis, W. C.; James, T. H. Photogr. Sci. Eng. 1975, 19, 49. James, T. H. In The Theory of the Photographic Process, 4th ed.; James, T. H., Ed.; Macmillan: New York 1977; p 164. Janusonis, G. A. Photogr. Sci. Eng. 1978, 22, 297.
30. Babcock, T. A.; Ferguson, P. M.; Lewis, W. C.; James, T. H. Photogr. Sci. Eng. 1975, 19, 49. James, T. H. In The Theory of the Photographic Process, 4th ed.; James, T. H., Ed.; Macmillan: New York 1977; p 164. Janusonis, G. A. Photogr. Sci. Eng. 1978, 22, 297.
31. Babcock, T. A.; Ferguson, P. M.; Lewis, W. C.; James, T. H. Photogr. Sci. Eng. 1975, 19, 49. James, T. H. In The Theory of the Photographic Process, 4th ed.; James, T. H., Ed.; Macmillan: New York 1977; p 164. Janusonis, G. A. Photogr. Sci. Eng. 1978, 22, 297.
32. Klaus, R. L.; et al. U.S. Patent Number 5,219,721, June 15, 1993.
33. Allen, C. F. U.S. Patent 2728663, Dec 27, 1955.
34. The red light destruction of the R-sensitization spectroscopic signatures appears to be very similar to the Herschel effect. See: Bacon, R. E. In The Theory of the Photographic Process, 4th ed.; James, T. H. Ed., Macmillan; New York, 1977; pp 182-193.
35. Shields, L.; Symons, M. R. C. Mol. Phys. 1966, 11, 57. Eachus, R. S.; Symons, M. R. C. J. Chem. Soc. A 1970, 1329.
36. Shields, L.; Symons, M. R. C. Mol. Phys. 1966, 11, 57. Eachus, R. S.; Symons, M. R. C. J. Chem. Soc. A 1970, 1329.
37. Davies, J. J.; Nicholls, J. E. J. Phys. C 1982, 15, 5321.
38. Tani, T. Paper Summary Book, International East-West Symposium III, Maui, HI, November, 1992; p A-11.
39. Beutel, V.; Bohm, H.-J.; Demtroder, W.; Eckel, H.-A.; Gress, J. Kuhn M.; A. Sasso, A. Laser Chem. 1991, 11, 209. Harbich, W.; Fedrigo, S.; Meyer F.; Lindsay, D. M.; Lignieres, J.; Rivoal, J. C.; Kreisle, D. J. Chem. Phys. 1990, 93, 8535. Ketter, U. L.; Bechthold, P. S.; Krasser, W. In Physics and Chemistry of Small Clusters; Jena, P., Rao, B. K., Khanna, S. N., Eds.; NATO ASI Series B 158; 1986; p 589. Morse, M. D. Chem Rev. 1986, 86, 1049.
40. Beutel, V.; Bohm, H.-J.; Demtroder, W.; Eckel, H.-A.; Gress, J. Kuhn M.; A. Sasso, A. Laser Chem. 1991, 11, 209. Harbich, W.; Fedrigo, S.; Meyer F.; Lindsay, D. M.; Lignieres, J.; Rivoal, J. C.; Kreisle, D. J. Chem. Phys. 1990, 93, 8535. Ketter, U. L.; Bechthold, P. S.; Krasser, W. In Physics and Chemistry of Small Clusters; Jena, P., Rao, B. K., Khanna, S. N., Eds.; NATO ASI Series B 158; 1986; p 589. Morse, M. D. Chem Rev. 1986, 86, 1049.
41. Beutel, V.; Bohm, H.-J.; Demtroder, W.; Eckel, H.-A.; Gress, J. Kuhn M.; A. Sasso, A. Laser Chem. 1991, 11, 209. Harbich, W.; Fedrigo, S.; Meyer F.; Lindsay, D. M.; Lignieres, J.; Rivoal, J. C.; Kreisle, D. J. Chem. Phys. 1990, 93, 8535. Ketter, U. L.; Bechthold, P. S.; Krasser, W. In Physics and Chemistry of Small Clusters; Jena, P., Rao, B. K., Khanna, S. N., Eds.; NATO ASI Series B 158; 1986; p 589. Morse, M. D. Chem Rev. 1986, 86, 1049.
42. Beutel, V.; Bohm, H.-J.; Demtroder, W.; Eckel, H.-A.; Gress, J. Kuhn M.; A. Sasso, A. Laser Chem. 1991, 11, 209. Harbich, W.; Fedrigo, S.; Meyer F.; Lindsay, D. M.; Lignieres, J.; Rivoal, J. C.; Kreisle, D. J. Chem. Phys. 1990, 93, 8535. Ketter, U. L.; Bechthold, P. S.; Krasser, W. In Physics and Chemistry of Small Clusters; Jena, P., Rao, B. K., Khanna, S. N., Eds.; NATO ASI Series B 158; 1986; p 589. Morse, M. D. Chem Rev. 1986, 86, 1049.
43. Becke, A. D. Phys. Rev. A 1988, 38, 3098.
44. Lee, C.; Yang, W.; Parr, R. G. Phys. Rev. B 1988, 37, 785.
45. Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Gill, P. M. W.; Johnson, B. G.; Robb, M. A.; Cheeseman, J. R., Keith, T. A.; Peterson, G. A.; Montgomery, J. A.; Raghavachari, K.; Al-Laham, M. A.; Zakrzewski, V. G.; Ortiz. J. V.; Foresman, J. B.; Cioslowski, J.; Stetanov, B. B.; Nanayakkara, A.; Challacombe, M.; Peng, C. Y.; Ayala, P. Y.; Chen, W.; Wong, M. W.; Andres, J. L.; Replogle, E. S.; Gomperts, R.; Martin, R. L.; Fox, D. J.; Binkley, J. S.; Detrees, D. J.; Baker, J.; Stewart, J. P.; Head-Gordon, M.; Gonzalez, C.; Pople, J. A. Gaussian 94, Revision D.4; Gaussian, Inc.: Pittsburgh, PA, 1995.
46. Foresman, J. B.; Head-Gordon. M.; Pople, J. A.; Frisch, M. J. J. Chem. Phys. 1992, 96, 135.
47. Simard, B.; Hackett, P. A. Chem. Phys. Lett. 1991, 186, 415.
48. Zhang, H.; Balasubramanian, K. J. Chem. Phys. 1993, 98, 7092.
49. Baetzold, R. C.; Hansen, J. Unpublished results.
50. Knoppik, D.; Losch, A. J. Cryst. Growth 1976, 34, 332. Van Der Voort, E.; Hartman, P. J. Cryst. Growth 1990, 104, 450.
51. Knoppik, D.; Losch, A. J. Cryst. Growth 1976, 34, 332. Van Der Voort, E.; Hartman, P. J. Cryst. Growth 1990, 104, 450.
52. Baetzold, R. C. J. Phys. Chem. B 1997, 101, 8180.
53. Fedrigo, S.; Harbich, W.; Buttet, J. J. Chem. Phys. 1993, 99, 5712.
54. Baetzold, R. C. Submitted to J. Imaging Sci. Technol.
55. 1 state would exclude this relaxation but is beyond the scope of the current investigations.
56. Kawasaki, M.; Tsujimura, Y.; Hada, H. Phys. Rev. Lett., 1986, 57, 2796.