Morphologies of ZnO nanorods

Chinese Physics Letters

Volumn 18, Issue 11, 2001, Pages 1527-1528

  Li, Jian Ye ^a,b   Chen, Xiao Long ^a   Wei, Zhi Feng ^a,b   Qiao, Zhi Yu ^b  

^a INSTITUTE OF PHYSICS   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ENAMELS; FIELD EMISSION MICROSCOPES; II-VI SEMICONDUCTORS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZINC OXIDE;

DIFFRACTION FIELDS; ELECTRONS ENERGY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; POWDERS X-RAY DIFFRACTIONS; REACTION METHOD; SCANNING ELECTRON MICROSCOPY IMAGE; SIMPLE REACTION; ZNO NANOROD;

NANORODS;

EID: 0035647849     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/18/11/332     Document Type: Article

References (12)

1. Choopun S, Vispute R D, Noch W, Balsamo A, Sharma R P, Venkatesan T, Ilidis A and Look D C 1999 Appl. Phys. Lett. 75 3947
2. Li Y, Meng G W, Zhang L D and Phillipp F 2000 Appl. Phys. Lett. 76 2011
3. Makino T, Chia C H, Tuan N T, Segawa Y, Kawasaki M, Ohtomo A, Tamura K and Koinuma H 2000 Appl. Phys. Lett. 76 3549
4. Sun Y, Ketterson J B and Wong G K L 2000 Appl. Phys. Lett. 77 2322
5. Konenkamp R, Boedecker K, Lur-Steiner M C, Poschenrieder M, Zenia F, Levy-Clement C and Wagner S 2000 Appl. Phys. Lett. 77 2575
6. Seidl M, Schurr M, Brugger A, Volz E and Voit H 1999 Appl. Phys. A 68 81
7. Guo L, Yang S, Yang C, Yu P, Wang J, Ge W and Wong G K L 2000 Appl. Phys. Lett. 76 2901
8. Wu H Z, He K M, Qiu D J and Huang D M 2000 J. Cryst. Growth 217 131
9. Wu R, Xie C, Xia H, Hu J and Wang A 2000 J. Cryst. Growth 217 274
10. Li J Y, Chen X L, Li H, He M and Qiao Z Y 2001 J. Cryst. Growth (at press)
11. Chen X L, Li J Y, Cao Y G, Lan Y C, Li H, He M, Wang C Y, Zhang Z and Qiao Z Y 2000 Adv. Mater. 12 1432
12. JCPDS-International Center for Diffraction Data, JCPDS-ICDD 2000