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Materials Research Society Symposium - Proceedings

Volumn 675, Issue , 2001, Pages

X-ray reflectivity of ultra-thin diamond-like carbon films

(4) Tanner, B K a LiBassi, A a Ferrari, A C a Robertson, J a

a POLITECNICO DI MILANO (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; FILM GROWTH; HARD DISK STORAGE; INTERFACES (MATERIALS); REFLECTION; THICKNESS MEASUREMENT; ULTRATHIN FILMS; VACUUM FURNACES; X RAYS;

FILTERED CATHODIC VACUUM ARC; GRAZING INCIDENCE X RAY REFLECTIVITY; TETRAHEDRAL AMORPHOUS CARBON; X RAY REFLECTIVITY;

DIAMOND LIKE CARBON FILMS;

EID: 0035559681 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (5)

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