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Volumn 648, Issue , 2001, Pages
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STM characterization of Cu thin films grown by direct ion deposition
a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
COPPER;
EPITAXIAL GROWTH;
FILM GROWTH;
ION BEAM ASSISTED DEPOSITION;
KINETIC ENERGY;
MOLECULAR DYNAMICS;
MONTE CARLO METHODS;
SURFACE ROUGHNESS;
DIRECT ION DEPOSITIONS;
HOMOEPITAXIAL FILMS;
THIN FILMS;
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EID: 0035557533
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (16)
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