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Volumn 648, Issue , 2001, Pages

STM characterization of Cu thin films grown by direct ion deposition

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COPPER; EPITAXIAL GROWTH; FILM GROWTH; ION BEAM ASSISTED DEPOSITION; KINETIC ENERGY; MOLECULAR DYNAMICS; MONTE CARLO METHODS; SURFACE ROUGHNESS;

EID: 0035557533     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.