Characterization of a-SiNx:H/a-Si:H MIS structure using capacitance techniques

Journal of the Korean Physical Society

Volumn 39, Issue SUPPL. Part 1, 2001, Pages

  Park, Hyuk Ryeol ^a   Lee, Suk Ho ^a   Lee, Byung Taek ^b  

^a Mokpo National University   (South Korea)

^b Chonnam National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035542205     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

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