Leakage current-voltage characteristics of ferroelectric thin film capacitors

Journal of the Korean Physical Society

Volumn 38, Issue 6, 2001, Pages 723-728

  Lee, Kwangbae ^a   Rhee, Byung Roh ^a   Lee, Chanku ^b  

^a Sangji University   (South Korea)

^b Optron Tec Inc   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035534283     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)

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