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Volumn 223, Issue 3, 2001, Pages 635-648
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Numerical determination of shallow electronic states bound by dislocations in semiconductors
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UNIV LILLE
(France)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035530750
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-3951(200102)223:3<635::AID-PSSB635>3.0.CO;2-K Document Type: Article |
Times cited : (21)
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References (27)
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