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Volumn 223, Issue 1, 2001, Pages 307-311

Pressure dependence of defect emissions and the appearance of pressure-induced deep centers in chalcopyrite alloys AgxCu1-xGaS2

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Indexed keywords


EID: 0035529164     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200101)223:1<307::AID-PSSB307>3.0.CO;2-2     Document Type: Article
Times cited : (1)

References (12)
  • 6
    • 77956670249 scopus 로고    scopus 로고
    • Eds. T. SUSKI and W. PAUL, Academic Press, New York
    • MING-FU LI and P.Y. YU, Semiconductors and Semimetals, Vol. 54a, Eds. T. SUSKI and W. PAUL, Academic Press, New York 1998 (p. 457).
    • (1998) Semiconductors and Semimetals , vol.54 A , pp. 457
    • Li, M.-F.1    Yu, P.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.