Chapter 5.2 High-Pressure Study of DX Centers Using Capacitance Techniques

Semiconductors and Semimetals

Volumn 54, Issue C, 1998, Pages 457-484

  Li, Ming fu ^a   Yu, Peter Y ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DX CENTERS; HIGH PRESSURE STUDY;

COLOR CENTERS;

EID: 77956670249     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(08)60234-3     Document Type: Article

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