Measurements of subgrain growth in a single-phase aluminum alloy by high-resolution EBSD

Materials Characterization

Volumn 47, Issue 3-4, 2001, Pages 235-240

  Huang, Y ^a   Humphreys, F J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Activation energy; Misorientation; Mobility; Single crystal; Subgrain boundary

Indexed keywords

ACTIVATION ENERGY; ANNEALING; BACKSCATTERING; COMPACTION; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEFORMATION; ELECTRON DIFFRACTION; FIELD EMISSION MICROSCOPES; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; HIGH TEMPERATURE EFFECTS; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; STRAIN;

ELECTRON BACKSCATTERED DIFFRACTIONS (EBSD); FIELD EMISSION GUN SCANNING ELECTRON MICROSCOPES (FEGSEM);

ALUMINUM ALLOYS;

EID: 0035521370     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(01)00175-9     Document Type: Article

References (11)

1. Discontinuous subgrain growth in deformed and annealed {110}〈001〉 aluminum single crystals
2. Subgrain growth and low angle boundary mobility in aluminum crystals of orientation {110}〈001〉
3. The annealing behaviour of deformed cube-oriented aluminum single crystals
4. Orientation imaging: The emergence of a new microscopy
5. Quantitative metallography by electron backscattered diffraction
6. Electron backscatter diffraction of grain and subgrain structures - Resolution considerations
7. On the theory of normal and abnormal grain growth
8. A network model for recovery and recrystallisation
9. The annealing kinetics of voids and the self diffusion coefficient in aluminum