Growth and characterization of Fe(100)/InAs(100) hybrid structures

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 6, 2001, Pages 2280-2283

  Ohno, Hiroshi ^a   Yoh, Kanji ^a   Doi, Toshihiro ^a   Subagyo, Agus ^a   Sueoka, Kazuhisa ^a   Mukasa, Koichi ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COERCIVE FORCE; CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; IRON; LOW ENERGY ELECTRON DIFFRACTION; MAGNETIC PROPERTIES; OHMIC CONTACTS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING INDIUM COMPOUNDS; SQUIDS; THERMAL EFFECTS;

BODY CENTERED CUBIC; FOUR TERMINAL CONTACT RESISTANCE MEASUREMENT; HYBRID STRUCTURES; INDIUM ARSENIDE;

EPITAXIAL GROWTH;

EID: 0035519496     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1421563     Document Type: Article

References (20)

1. G. A. Prinz, in Ultrathin Magnetic Structures II, edited by B. Heinrich and J. A. C. Bland (Springer, Berlin, 1994), pp. 1-44.
2. A. Cabbibo, J. R. Childfress, S. J. Pearton, F. Ren, and J. M. Kuo, J. Vac. Sci. Technol. A 15, 1215 (1997).
3. M. Oestreich, J. Hübner, D. Hägele, P. J. Klar, W. Heimbrodt, W. W. Rühle, D. E. Ashenford, and B. Lunn, Appl. Phys. Lett. 74, 1251 (1999).
4. A. Hirohata, Y. B. Xu, C. M. Guertler, and J. A. C. Bland, J. Appl. Phys. 85, 5804 (1999).
5. G. Schmidt, G. Müller, L. W. Molenkamp, M. Behet, J. De. Boeck, and P. Panissod, J. Magn. Magn. Mater. 198, 134 (1999).
6. S. Datta and B. Das, Appl. Phys. Lett. 56, 665 (1990).
7. J. Nitta, T. Akazaki, H. Takayanagi, and T. Enoki, Phys. Rev. Lett. 78, 1335 (1997).
8. J. Luo, H. Munekata, F. F. Fang, and P. J. Stiles, Phys. Rev. B 38, 10 142 (1998).
9. E. A. de Andrada e Silva, G. C. La Rocca, and F. Bassani, Phys. Rev. B 50, 8523 (1994).
10. Y. B. Xu, E. T. M. Kernohan, M. Tselepi, J. A. C. Bland, and S. Holmes, Appl. Phys. Lett. 73, 399 (1998).
11. W. Y. Lee, S. Gardelis, B.-C. Choi, Y. B. Xu, C. G. Smith, C. H. W. Barnes, D. A. Ritchie, E. H. Linfield, and J. A. C. Bland, J. Appl. Phys. 85, 6682 (1999).
12. P. R. Hammar, B. R. Bennett, M. J. Yang, and M. Johnson, Phys. Rev. Lett. 83, 203 (1999).
13. J. J. Krebs, B. T. Jonker, and G. A. Prinz, J. Appl. Phys. 61, 2596 (1987).
14. M. Rahmoune, J. P. Eymery, P. Goudeau, and M. F. Denanot, Thin Solid Films 289, 261 (1996).
15. C. M. Teodorescu, F. Chevrier, C. Richter, V. Ilakovac, O. Heckmann, L. Lechevalier, R. Brochier, R. L. Johnson, and K. Hricovini, Appl. Surf. Sci. 166, 137 (2000).
16. H. Schönherr, R. Nötzel, W. Ma, and K. H. Ploog, J. Appl. Phys. 89, 169 (2001).
17. M. H. Kryder, K. Y. Ahn, N. J. Mazzeo, S. Schwarzl, and S. M. Kane, IEEE Trans. Magn. 16, 99 (1980).
18. A. O. Adeyeye, G. Lauhoff, J. A. C. Bland, C. Daboo, D. G. Hasko, and H. Ahmed, Appl. Phys. Lett. 70, 1046 (1997).
19. K. Kajiyama, Y. Mizushima, and S. Sakata, Appl. Phys. Lett. 23, 458 (1973).
20. C. A. Mead and W. G. Spitzer, Phys. Rev. Lett. 10, 471 (1963).