SCOPUS 정보 검색 플랫폼

Volumn 109, Issue 1275, 2001, Pages 903-910

Crystal structure analysis using high-resolution synchrotron radiation powder diffraction data

a NAGOYA INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Ab initio structure determination; High resolution synchrotron radiation powder diffraction; Multiple detector system; Powder diffraction method; Rietveld method; Structure refinement; Weighting scheme

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; HIGH RESOLUTION ELECTRON MICROSCOPY; LEAST SQUARES APPROXIMATIONS; PHOTONS; SYNCHROTRON RADIATION; X RAY POWDER DIFFRACTION;

DIRECT SPACE METHODS; HIGH RESOLUTION SYNCHROTRON RADIATION; RIETVELD METHODS;

POWDERS;

EID: 0035517744 PISSN: 09145400 EISSN: None Source Type: Journal
DOI: 10.2109/jcersj.109.1275_903 Document Type: Article

Times cited : (2)

References (44)

1
- 0002211129
- (1969) J. Appl. Cryst. , vol.2 , pp. 65-71
- Rietveld, H.M.¹

2
- 0001362247
- (1981) J. Appl. Cryst. , vol.14 , pp. 357-361
- Pawley, G.S.¹

3
- 0000023606
- (1986) J. Appl. Cryst. , vol.19 , pp. 440-447
- Toraya, H.¹

4
- 0023978710
- (1988) Mater. Res. Bull. , vol.23 , pp. 447-452
- Le Bail, A.¹ Duroy, H.² Fourquet, J.L.³

5
- 0001835674
- (1980) Reports Res. Lab. Engin. Mater. Tokyo Inst. Tech. , vol.5 , pp. 55-64
- Toraya, H.¹ Marumo, F.²

6
- 0003301880
- (1978) J. Appl. Cryst. , vol.11 , pp. 165-172
- Glazer, A.M.¹ Hidaka, M.² Bordas, J.³

7
- 0022999611
- (1986) S. Adv. X-ray Anal. , vol.29 , pp. 243-250
- Parrish, W.¹ Hart, M.² Erickson, C.G.³ Masciocchi, N.⁴ Huang, T.C.⁵

8
- 0021407239
- (1984) J. Appl. Cryst. , vol.17 , pp. 85-95
- Hastings, J.B.¹ Thomlinson, W.² Cox, D.E.³

9
- 0030505894
- (1996) J. Synchrotron Rad. , vol.3 , pp. 75-83
- Toraya, H.¹ Hibino, H.² Ohsumi, K.³

10
- 84885534242
- (1987) Z. Kristallogr. , vol.179 , pp. 161-173
- Parrish, W.¹ Hart, M.²

11
- 4244067518
- (1991) Mater. Sci. Forum. , vol.79-82 , pp. 447-454
- Hart, M.¹

12
- 0000006978
- (1995) J. Synchrotron Rad. , vol.2 , pp. 143-147
- Toraya, H.¹ Takata, M.² Hibino, H.³ Yoshino, J.⁴ Ohsumi, K.⁵

13
- 0032222061
- (1998) J. Synchrotron Rad. , vol.5 , pp. 1270-1274
- Roberts, M.A.¹ Tang, C.C.²

14
- 0007722099
- Abstract of symposium on accuracy in powder diffraction III
- (2001) , pp. 1
- Fitch, A.N.¹

15
- 0000632509
- (1999) J. Appl. Cryst. , vol.32 , pp. 1145-1151
- Fujinawa, G.¹ Toraya, H.² Staudenmann, J.-L.³

16
- 0007707956
- (1996) Abstracts of Denver X-ray Conf. & Powder Diffraction Satellite Meeting of the XVII Congress of the IUCr , pp. 79
- Hedeau, J.L.¹ Bordet, P.² Anne, M.³ Part, A.⁴ Fitch, A.N.⁵ Dooryhee, E.⁶ Vaughan, G.⁷

17
- 0027814343
- (1993) J. Appl. Cryst. , vol.26 , pp. 774-777
- Toraya, H.¹ Huang, T.C.² Wu, Y.³

18
- 0007682266
- (1999) Abstract of XVIIIth IUCr Congress and General Assembly , pp. 239
- Kaps, W.-H.¹ Ihringer, J.² Prandl, W.³ Schilling, M.⁴

19
- 0007669041
- (2000) Annual Rep. Cermics Res. Lab., Nagoya Inst. Tech. , vol.10 , pp. 17-22
- Yamazaki, S.¹ Toraya, H.²

20
- 0001250459
- (1987) J. Appl. Cryst. , vol.20 , pp. 316-319
- David, W.I.F.¹

21
- 0026910159
- (1992) J. Appl. Cryst. , vol.25 , pp. 539-543
- Estermann, M.A.¹ McCusker, L.B.² Baerlocher, C.³

22
- 85037291873
- [in Japanese]
- (1997) Annual Rep. Cermics Res. Lab., Nagoya Inst. Tech. , vol.7 , pp. 1-9
- Toraya, H.¹

23
- 85114213314
- (1995) J. Appl. Cryst. , vol.28 , pp. 842-846
- Altomare, A.¹ Burla, M.C.² Cascarano, G.³ Giacovazzo, C.⁴ Guagliardi, A.⁵ Moliterni, A.G.G.⁶ Polidori, G.⁷

24
- 0000604488
- (1994) J. Appl. Cryst. , vol.27 , pp. 435-436
- Altomare, A.¹ Cascarano, G.² Giacovazzo, C.³ Guagliardi, A.⁴ Burla, M.C.⁵ Polidori, G.⁶ Camalli, M,⁷

25
- 0026853606
- (1992) J. Appl. Cryst. , vol.25 , pp. 310-317
- Cascarano, G.¹ Favia, L.² Giacovazzo, C.³

26
- 0002562577
- (1997) J. Appl. Cryst. , vol.30 , pp. 92-97
- Carrozzini, B.¹ Giacovazzo, C.² Guagliardi, A.³ Rizzi, R.⁴ Burla, M.C.⁵ Polidori, G.⁶

27
- 0000768201
- (1996) Acta Cryst. , vol.52 A , pp. 331-339
- Giacovazzo, C.¹

28
- 0002532403
- (1994) J. Solid State Chem. , vol.111 , pp. 52-57
- Morris, R.E.¹ Owen, J.J.² Stalick, J.K.³ Cheetham, A.K.⁴

29
- 85037300942
- (in preparation)
- Ohnishi, T.¹ Ida, T.² Toraya, H.³

30
- 0007270122
- (2001) Acta Cryst. , vol.57 B , pp. 184-189
- Tanahashi, Y.¹ Nakamura, H.² Yamazaki, S.³ Kojima, Y.⁴ Saito, H.⁵ Ida, T.⁶ Toraya, H.⁷

31
- 0035533439
- (2001) Powder Diffraction , vol.16 , pp. 65-70
- Nakamura, H.¹ Yamazaki, S.² Ohnishi, T.³ Ida, T.⁴ Toraya, H.⁵

32
- 0000736496
- (1996) Chem. Mater. , vol.8 , pp. 2554-2570
- Harris, K.D.M.¹ Tremayne, M.²

33
- 5744249209
- (1953) J. Chem. Phys. , vol.21 , pp. 1087-1092
- Metropolis, N.¹ Rosenbluth, A.W.² Rosenbluth, M.N.³ Teller, A.H.⁴ Teller, E.⁵

34
- 0000105988
- (1956) Nature , vol.177 , pp. 390-391
- Megaw, H.D.¹ Kelsey, C.H.²

35
- 0033373588
- (1999) Am. Mineral , vol.84 , pp. 1613-1621
- Merlino, S.¹ Bonaccorsi, E.² Armbruster, T.³

36
- 85037324685
- (in press)
- (2001) J. Am. Ceram. Soc.
- Yamazaki, S.¹ Toraya, H.²

37
- 0001295640
- (1994) J. Am. Chem. Soc. , vol.116 , pp. 3543-3547
- Harris, K.D.M.¹ Tremayne, M.² Lightfoot, P.³ Bruce, P.⁴

38
- 2842521333
- (1996) J. Appl. Cryst. , vol.29 , pp. 211-214
- Tremayne, M.¹ Kariuki, B.M.² Harris, K.D.M.³

39
- 0000730283
- (1994) J. Appl. Cryst. , vol.27 , pp. 802-844
- Hill, R.D.¹ Cranswick, L.M.D.²

40
- 0019911174
- Springer-Verlag
- (1982) Mathematical Techniques in Crystallography and Materials Science
- Prince, E.¹

41
- 0003627422
- Ed. by C. Giacovazzo, Oxford University Press
- (1994) Fundamentals of Crystallography , pp. 365-375
- Vitervo, D.¹

42
- 0000512635
- (1998) J. Appl. Cryst. , vol.31 , pp. 333-343
- Toraya, H.¹

43
- 0002699617
- (1999) J. Appl. Cryst. , vol.32 , pp. 51-59
- Yamazaki, S.¹ Toraya, H.²

44
- 0034480468
- (2000) J. Appl. Cryst. , vol.33 , pp. 95-102
- Toraya, H.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.