Parallel-slit analyzer developed for the purpose of lowering tails of diffraction profiles

Journal of Applied Crystallography

Volumn 32, Issue 6, 1999, Pages 1145-1151

  Fujinawa, Go ^a   Toraya, H ^b   Staudenmann, J L ^c  

^a RIGAKU CORPORATION   (Japan)

^b NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000632509     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899011462     Document Type: Article

References (7)

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4. Roberts, M. A. & Tang, C. C. (1998). J. Synchrotron Rad. 5, 1270-1274.
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6. Toraya, H. (1990). J. Appl. Cryst. 23, 485-491.
7. Toraya, H., Takata, M., Hibino, H., Yoshino, J. & Ohsumi, K. (1995). J. Synchrotron Rad. 2, 143-147.