Second derivative Langmuir probe measurements of negative oxygen ion concentration taking into account the plasma depletion caused by negative ion sink on the probe surface

Plasma Sources Science and Technology

Volumn 10, Issue 4, 2001, Pages 614-620

  Popov, Tsviatko K ^a,b   Gateva, Sanka V ^a  

^a INSTITUTE OF ELECTRONICS   (Bulgaria)

^b UNIVERSITY OF SOFIA   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRODES; IONIC STRENGTH; OXYGEN; PLASMA PROBES; PRESSURE EFFECTS;

LASER PHOTODETACHMENT MEASUREMENTS;

NEGATIVE IONS;

EID: 0035507038     PISSN: 09630252     EISSN: None     Source Type: Journal    
DOI: 10.1088/0963-0252/10/4/310     Document Type: Article

References (31)