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Volumn 115, Issue 17, 2001, Pages 8178-8184
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Localized oscillations and Fraunhofer diffraction in crystalline phases of a monolayer
a a b a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTALLINE MATERIALS;
GRANULAR MATERIALS;
INTERFACES (MATERIALS);
MICA;
OSCILLATIONS;
PHASE COMPOSITION;
SURFACE PROPERTIES;
BREWSTER ANGLE AUTOCORRELATION SPECTROSCOPY;
GRAIN WOBBLING;
MULTILAYER GRANULES;
MONOLAYERS;
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EID: 0035505004
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1409401 Document Type: Article |
Times cited : (25)
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References (22)
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