Real-time high-resolution transmission electron microscopy observation of the growth process of (0 0 1) surfaces on a nanometer-sized Si multiply twinned particle

Surface Science

Volumn 493, Issue 1-3, 2001, Pages 414-419

  Takeguchi, Masaki ^a   Tanaka, Miyoko ^a   Yasuda, Hidehiro ^a   Furuya, Kazuo ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Electron microscopy; Growth; Silicon; Single crystal surfaces; Surface stress

Indexed keywords

DEFORMATION; DIMERS; ELASTICITY; GROWTH KINETICS; HIGH RESOLUTION ELECTRON MICROSCOPY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING; ULTRAHIGH VACUUM;

MULTIPLY TWINNED PARTICLES (MLP);

SEMICONDUCTING SILICON;

EID: 0035500870     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01247-X     Document Type: Conference Paper

References (22)