Part assessment guidelines and criteria for parts selection and management

IEEE Transactions on Electronics Packaging Manufacturing

Volumn 24, Issue 4, 2001, Pages 339-350

  Syrus, Toby ^b   Pecht, Michael G ^a,b   Humphrey, David ^c  

^a IEEE

^b UNIVERSITY OF MARYLAND   (United States)

^c HONEYWELL   (United States)

Author keywords

Assembly guidelines; Average outgoing quality; Component; Electronics industry; Integrated circuits; Integrity monitor test; Part assessment; Part group; Part selection; Process capability index; Semiconductor devices; Statistical process control

Indexed keywords

COMPONENTS; DATA ACQUISITION; DECISION MAKING; INTEGRATED CIRCUITS; MANAGEMENT; STATISTICAL PROCESS CONTROL;

INDUSTRY STANDARDS; PARTS SELECTION;

ELECTRON DEVICE MANUFACTURE;

EID: 0035493659     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/6104.980044     Document Type: Article

References (43)

1. Part manufacturer assessment process
2. Why a new parts selection and management program?
3. A risk-informed methodology for parts selection and management
4. Equipment supplier intervention techniques
5. Monitoring supplier quality at ppm levels
6. Estimating the percent nonconforming in the accepted product after zero defect sampling
7. pk
8. Test methods