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Volumn 90, Issue 7, 2001, Pages 3450-3454

Transport properties of submicron YBa2Cu3O7 - δ step-edge Josephson junctions

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EID: 0035476420 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1400098 Document Type: Article

Times cited : (8)

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