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Volumn 362, Issue 1-4, 2001, Pages 290-295
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Subgap structures in the current-voltage properties of La2-xSrxCuO4 intrinsic Josephson junctions
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Author keywords
Intrinsic Jsephson effect; La2 xSrxCuO4; Subgap structure
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CONDUCTANCE;
ELECTRIC POTENTIAL;
ENERGY GAP;
HIGH TEMPERATURE SUPERCONDUCTORS;
ION BEAMS;
LANTHANUM COMPOUNDS;
PLASMA OSCILLATIONS;
REACTIVE ION ETCHING;
SINGLE CRYSTALS;
THERMAL EFFECTS;
SUBGAP STRUCTURES;
JOSEPHSON JUNCTION DEVICES;
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EID: 0035448342
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(01)00690-6 Document Type: Article |
Times cited : (14)
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References (24)
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