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Volumn 299, Issue 1-2, 1998, Pages 31-35
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Collective switching and heat diffusion of stacked intrinsic Josephson junctions
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Author keywords
(Bi,Pb)2Sr2Ca2Cu3O10+x; Collective switching; Heat diffusion; Intrinsic josephson junction; Thin film
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Indexed keywords
CRYSTAL STRUCTURE;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CURRENTS;
ELECTRIC VARIABLES MEASUREMENT;
OXIDE SUPERCONDUCTORS;
SWITCHING;
THERMAL DIFFUSION;
COLLECTIVE SWITCHING;
CURRENT BIAS MEASUREMENT;
JOSEPHSON CRITICAL CURRENT;
VOLTAGE BIAS MEASUREMENT;
JOSEPHSON JUNCTION DEVICES;
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EID: 0032048849
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(98)00069-0 Document Type: Article |
Times cited : (11)
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References (12)
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