Subgap structures in intrinsic Josephson junctions of Tl2Ba2Ca2Cu3O10+δ and Bi2Sr2CaCu2O8+δ

Physical Review Letters

Volumn 76, Issue 26, 1996, Pages 4943-4946

  Schlenga, K ^a   Hechtfischer, G ^a   Kleiner, R ^a   Walkenhorst, W ^a   Muller P ^a   Johnson, H L ^b   Veith, M ^c   Brodkorb, W ^c   Steinbeiss, E ^c  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b CSIRO   (Australia)

^c LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CALCULATIONS; CRYSTALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRONIC DENSITY OF STATES; JOSEPHSON JUNCTION DEVICES; MAGNETIC FIELDS; SUPERLATTICES; THALLIUM COMPOUNDS;

JOSEPHSON EFFECT; RESISTIVELY SHUNTED JUNCTION MODEL; SUBGAP STRUCTURES;

BAND STRUCTURE;

EID: 0030165220     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.4943     Document Type: Article

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