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Volumn 179, Issue 4, 2001, Pages 485-496
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Density and binding effects in low-energy sputtering
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Author keywords
Computer simulation; Density and binding effects; Depth of origin; Sputtering; Sputtering yield
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Indexed keywords
AMORPHOUS MATERIALS;
BINDING ENERGY;
COMPUTER SIMULATION;
ION BOMBARDMENT;
TARGETS;
BOMBARDING ENERGY;
SPUTTERING;
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EID: 0035447594
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(01)00602-4 Document Type: Article |
Times cited : (7)
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References (61)
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