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Volumn 179, Issue 4, 2001, Pages 485-496

Density and binding effects in low-energy sputtering

Author keywords

Computer simulation; Density and binding effects; Depth of origin; Sputtering; Sputtering yield

Indexed keywords

AMORPHOUS MATERIALS; BINDING ENERGY; COMPUTER SIMULATION; ION BOMBARDMENT; TARGETS;

EID: 0035447594     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00602-4     Document Type: Article
Times cited : (7)

References (61)
  • 18
    • 0003717726 scopus 로고
    • Thesis, University of California, Berkeley
    • (1965)
    • Schlaug, R.N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.