Electrical properties of Bi-2212 whisker using Ag film electrodes

Physica C: Superconductivity and its Applications

Volumn 362, Issue 1-4, 2001, Pages 333-337

  Kawae, T ^a   Kim, S J ^a,b   Nakajima, K ^a,b   Yamashita, T ^a,b   Kishida, S ^c  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c TOTTORI UNIVERSITY   (Japan)

Author keywords

Bi 2212 whisker; Intrinsic Josephson junction; Small Ag film electrodes

Indexed keywords

BISMUTH COMPOUNDS; CONDUCTIVE FILMS; DRY ETCHING; ELECTRIC PROPERTIES; ELECTROCHEMICAL ELECTRODES; HIGH TEMPERATURE SUPERCONDUCTORS; ION BEAMS; JOSEPHSON JUNCTION DEVICES; SILVER;

FOCUSED ION BEAM (FIB) ETCHING; THIN FILM ELECTRODES;

CRYSTAL WHISKERS;

EID: 0035447219     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(01)00699-2     Document Type: Article

References (9)