메뉴 건너뛰기




Volumn 54, Issue 9, 2001, Pages 453-457

Atomic-force-microscopy for the investigation of inhomogeneous polymer-systems;Kraftmikroskopische untersuchungen inhomogener elastomersysteme

Author keywords

Atomic force microscopy; Force indentation curves; Inhomogeneity; Layered imaging; Stiffness imaging

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; STIFFNESS; SURFACE ROUGHNESS;

EID: 0035443385     PISSN: 09483276     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (12)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.