Crystallography and structural evolution of LiNbO3 and LiNb1-xTaxO3 films on sapphire prepared by high-rate thermal plasma spray chemical vapor deposition

Journal of Materials Research

Volumn 16, Issue 8, 2001, Pages 2271-2279

  Shtansky, D V ^a,b   Kulinich, S A ^a   Terashima, K ^a   Yoshida, T ^a   Ikuhara, Y ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b NATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY MISIS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; FILM GROWTH; LATTICE CONSTANTS; LITHIUM COMPOUNDS; NUCLEATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SAPPHIRE; STRAIN; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

COMPRESSIVE STRAIN;

THIN FILMS;

EID: 0035436216     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2001.0312     Document Type: Article

References (35)