Estimation of organic molecular film structures using surface-plasmon resonance spectroscopy

Thin Solid Films

Volumn 393, Issue 1-2, 2001, Pages 114-118

  Zhou, Minniu ^a   Otomo, Akira ^a   Yokoyama, Shiyoshi ^a   Mashiko, Shinro ^a  

^a Ministry of Posts and Telecommunications   (Japan)

Author keywords

Infrared spectroscopy; Langmuir Blodgett films; Organic substances; Surface plasmons

Indexed keywords

ATOMIC FORCE MICROSCOPY; INFRARED SPECTROSCOPY; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; SENSITIVITY ANALYSIS; SUBSTRATES; SURFACE PLASMON RESONANCE; SURFACE ROUGHNESS;

SURFACE PLASMON RESONANCE SPECTROSCOPY;

LANGMUIR BLODGETT FILMS;

EID: 0035423580     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01114-2     Document Type: Article

References (11)

1. Investigation of organic-molecular-film structures using surface-plasmon-resonance spectroscopy