Determining the relative permittivity and thickness of a lossless dielectric overlayer on a metal film using optically excited surface plasmon polaritons

Journal of Physics D: Applied Physics

Volumn 29, Issue 4, 1996, Pages 1080-1087

  Phelps, J M ^a   Taylor, D M ^a  

^a BANGOR UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CALCULATIONS; COMPUTER SIMULATION; GOLD; METALLIC FILMS; PERMITTIVITY MEASUREMENT; QUANTUM THEORY; SILVER; SURFACE WAVES; THICKNESS MEASUREMENT;

DIELECTRIC OVERLAYER; FRESNEL EQUATIONS; SURFACE PLASMON POLARITON;

DIELECTRIC MATERIALS;

EID: 0030127873     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/29/4/023     Document Type: Article

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