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Volumn 8, Issue 4, 2001, Pages 648-651

Dielectric study of thin films of Ta2O5 and ZrO2

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE; PERMITTIVITY; SPECTROSCOPIC ANALYSIS; SPUTTERING; SWITCHING; TANTALUM COMPOUNDS; ZIRCONIA;

EID: 0035414661     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.946718     Document Type: Article
Times cited : (6)

References (21)
  • 2
    • 0033285645 scopus 로고    scopus 로고
    • 5 thin film capacitors deposited by dc magnetron reactive sputtering for multichip module applications
    • (1999) Mat. Sci. Eng. , vol.B67 , pp. 108-112
    • Cho, S.D.1    Paik, K.W.2
  • 14
    • 0021425293 scopus 로고
    • Theoretical solution of the transient current equation for mobile ions in a dielectric field under the influence of a constant electric field
    • (1984) J. Appl. Phys. , vol.55 , pp. 3371-3375
    • Greeuw, G.1    Hoenders, B.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.