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Volumn 22, Issue 4, 2000, Pages 239-244
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Design of ADC sinewave histogram test
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Author keywords
Adc testing; Analog digital conversion; Uncertainty evaluation
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Indexed keywords
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EID: 0000004759
PISSN: 09205489
EISSN: None
Source Type: Journal
DOI: 10.1016/S0920-5489(00)00044-1 Document Type: Article |
Times cited : (9)
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References (5)
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