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Volumn 22, Issue 4, 2000, Pages 239-244

Design of ADC sinewave histogram test

Author keywords

Adc testing; Analog digital conversion; Uncertainty evaluation

Indexed keywords


EID: 0000004759     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(00)00044-1     Document Type: Article
Times cited : (9)

References (5)
  • 1
    • 0028446234 scopus 로고
    • Histogram measurement of ADC nonlinearities using sine waves
    • June
    • J. Blair, Histogram measurement of ADC nonlinearities using sine waves, IEEE Trans. Instrum. Meas. 43 (3) (1994) 373-383, June.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , Issue.3 , pp. 373-383
    • Blair, J.1
  • 2
    • 0003443355 scopus 로고
    • Standard for Digitizing Waveform Recorders
    • Dec.
    • Standard for Digitizing Waveform Recorders, IEEE Std. 1057, Dec. 1994.
    • (1994) IEEE Std. 1057
  • 5
    • 0033718611 scopus 로고    scopus 로고
    • ADC sinewave histogram testing with quasi-coherent sampling
    • Baltimore, MD, USA, May 1-4
    • P. Carbone, G. Chiorboli, ADC sinewave histogram testing with quasi-coherent sampling, Proc. IEEE Instrum. Meas. Tech. Conf., Baltimore, MD, USA, May 1-4, 2000.
    • (2000) Proc. IEEE Instrum. Meas. Tech. Conf.
    • Carbone, P.1    Chiorboli, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.