메뉴 건너뛰기




Volumn 40, Issue 19, 2001, Pages 3205-3210

Mueller matrix error correction for a fringe-free interferometry system

Author keywords

[No Author keywords available]

Indexed keywords

ERRORS; LIGHT POLARIZATION; LIQUID CRYSTALS; MATRIX ALGEBRA; POLARIMETERS;

EID: 0035411971     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.003205     Document Type: Article
Times cited : (2)

References (13)
  • 2
    • 0032075251 scopus 로고    scopus 로고
    • Unambiguous measurement of surface profile using a Sagnac interferometer with phase feedback
    • A. R. D. Sommervell and T. H. Barnes, “Unambiguous measurement of surface profile using a Sagnac interferometer with phase feedback,” Opt. Commun. 150, 61-65 (1998).
    • (1998) Opt. Commun. , vol.150 , pp. 61-65
    • Sommervell, A.R.D.1    Barnes, T.H.2
  • 3
    • 77956978378 scopus 로고
    • Phase-measurement interferometry techniques
    • Elsevier, New York
    • K. Creath, “Phase-measurement interferometry techniques,” in Progress in Optics (Elsevier, New York, 1988), Vol. 26.
    • (1988) Progress in Optics , vol.26
    • Creath, K.1
  • 4
    • 77956979212 scopus 로고
    • Advanced evaluation techniques in interferometry
    • Elsevier, New York
    • J. Schwider, “Advanced evaluation techniques in interferometry,” in Progress in Optics (Elsevier, New York, 1989), Vol. 28.
    • (1989) Progress in Optics , vol.28
    • Schwider, J.1
  • 5
    • 0028545665 scopus 로고
    • High-speed non-contact profiler based on scanning white-light interferometry
    • P. DeGroot and L. Deck, “High-speed non-contact profiler based on scanning white-light interferometry,” App. Opt. 33, 7334-7338 (1994).
    • (1994) App. Opt , vol.33 , pp. 7334-7338
    • Degroot, P.1    Deck, L.2
  • 6
    • 0032047788 scopus 로고    scopus 로고
    • Fast surface profiling by spectral analysis of white-light interferograms with Fourier transform spectroscopy
    • M. Hart, D. G. Vass, and M. L. Begbie, “Fast surface profiling by spectral analysis of white-light interferograms with Fourier transform spectroscopy,” App. Opt. 37, 1764-1769 (1998).
    • (1998) App. Opt. , vol.37 , pp. 1764-1769
    • Hart, M.1    Vass, D.G.2    Begbie, M.L.3
  • 7
    • 0001251054 scopus 로고    scopus 로고
    • Surface profilometry based on polarization analysis
    • J. P. Lesso, A. J. Duncan, W. Sibbett, and M. J. Padgett, “Surface profilometry based on polarization analysis,” Opt. Lett. 23, 1800-1802 (1998).
    • (1998) Opt. Lett. , vol.23 , pp. 1800-1802
    • Lesso, J.P.1    Duncan, A.J.2    Sibbett, W.3    Padgett, M.J.4
  • 10
  • 11
    • 0035057230 scopus 로고    scopus 로고
    • Unambiguous interferometric surface profilometry using liquid crystal modulators
    • M. L. Begbie, J. P. Lesso, W. Sibbett, and M. J. Padgett, “Unambiguous interferometric surface profilometry using liquid crystal modulators,” J. Electron. Imaging 10, 263-267 (2001).
    • (2001) J. Electron. Imaging , vol.10 , pp. 263-267
    • Begbie, M.L.1    Lesso, J.P.2    Sibbett, W.3    Padgett, M.J.4
  • 13
    • 0000510838 scopus 로고
    • Gratings made by photographing interference fringes (Abstract)
    • H. Mueller, “Gratings made by photographing interference fringes (abstract),” J. Opt. Soc. Am. 38, 661 (1948).
    • (1948) J. Opt. Soc. Am. , vol.38 , pp. 661
    • Mueller, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.