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Journal of Physics and Chemistry of Solids

Volumn 62, Issue 7, 2001, Pages 1219-1228

Optical and microstructural characterization of thin films of photochromic fulgides

(4) Jansson, Roger a Zangooie, Shahin b Kugler, Thomas c Arwin, Hans a

a LINKÖPING UNIVERSITY (Sweden)

b UNIVERSITY OF NEBRASKA LINCOLN (United States)

c ACREO AB (Sweden)

Author keywords

A. Organic compounds; D. Optical properties

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; DIELECTRIC PROPERTIES OF SOLIDS; ELLIPSOMETRY; INFRARED SPECTROSCOPY; LIGHT ABSORPTION; MATHEMATICAL MODELS; MICROSTRUCTURE; OPTICAL PROPERTIES; PHOTOCHROMISM; RESONANCE; SILICON; SPIN COATING; SURFACE ROUGHNESS; THIN FILMS; ULTRAVIOLET SPECTROSCOPY;

FULGIDES; SPECTROSCOPIC ELLIPSOMETRY;

OPTICAL FILMS;

EID: 0035400812 PISSN: 00223697 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3697(01)00012-9 Document Type: Article

Times cited : (8)

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