Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry

Journal of Applied Physics

Volumn 79, Issue 5, 1996, Pages 2663-2674

  Herzinger, C M ^a,d   Snyder, P G ^a   Celii, F G ^b   Kao, Y C ^b   Chow, D ^c   Johs, B ^d   Woollam, J A ^d  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b TEXAS INSTRUMENTS   (United States)

^c Hughes Aircraft Co   (United States)

^d J A WOOLLAM CO INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001237604     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361137     Document Type: Article

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