Gauge factor enhancement driven by heterogeneity in thick-film resistors

Journal of Applied Physics

Volumn 90, Issue 1, 2001, Pages 322-327

  Grimaldi, C ^a   Ryser, P ^a   Strassler S ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035396179     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1376672     Document Type: Article

References (20)

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