Surface potential measurement with high spatial resolution using a scanning Auger electron microscope

Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films

Volumn 19, Issue 4, 2001, Pages 1139-1142

  Sakai, Y ^a   Kudo, M ^a   Nielsen, C ^b  

^a JEOL LTD   (Japan)

^b JEOL USA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON SCATTERING; FERMI LEVEL; ION BEAMS; ION BOMBARDMENT; LIGHT EMITTING DIODES; MAGNETIC LEAKAGE; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACE CLEANING;

SCANNING AUGER ELECTRON MICROSCOPES;

INTERFACIAL ENERGY;

EID: 0035393831     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1359551     Document Type: Article

References (7)