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Volumn 142-144, Issue , 2001, Pages 449-454
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Plasma modification of polycarbonates
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Author keywords
B Ellipsometry; B Rutherford backscattering spectroscopy; C PACVD; C Sputtering; D Silicon oxide; X Polycarbonate
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Indexed keywords
DEPOSITION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
PLASTIC FILMS;
PROTECTIVE COATINGS;
SILICA;
STRESS ANALYSIS;
TENSILE STRESS;
OPTICAL CONSTANTS;
POLYCARBONATES;
COATING;
INDUSTRIAL APPLICATION;
PLASMA TREATMENT;
POLYCARBONATE;
PROTECTION;
SPUTTERING;
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EID: 0035387346
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(01)01134-3 Document Type: Article |
Times cited : (87)
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References (13)
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