Study of the origin of orientation ratio in high-density longitudinal magnetic recording media

IEEE Transactions on Magnetics

Volumn 37, Issue 4 I, 2001, Pages 1508-1511

  Ajan, Antony ^b   Acharya, B R ^a,b   Abarra, E N ^a,b   Okamoto, I ^a,b  

^a IEEE   (Japan)

^b Storage Systems Laboratories   (Japan)

Author keywords

Longitudinal magnetic recording media; Mechanical texturing; Orientation ratio

Indexed keywords

COERCIVE FORCE; CRYSTAL ORIENTATION; GRAIN SIZE AND SHAPE; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETIC ANISOTROPY; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY;

LONGITUDINAL MAGNETIC RECORDING MEDIA; MECHANICAL TEXTURING;

MAGNETIC RECORDING;

EID: 0035386786     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.950885     Document Type: Article

References (12)

1. In-plane anisortopy in thin-film media: Physical origins of orientation ratio
2. Crystallographic anisotropy in thin film magnetic recording media analyzed with x-ray diffraction
3. Control of crystallographic texture in magnetic thin films for ultra-high density storage media
4. Crystallographic orientation of textured CoCrTa/Cr sputtered thin film media for longitudinal recording
5. Simple analysis of torque measurement of magnetic thin films
6. Measurements of crystalline anisotropy on longitudinal media
7. Formation of crystallographic texture in rf sputter-deposted Cr thin films
8. Method of measuring anisotropy field of a recording medium investigated by computer simulation
9. Time-dependent magnetic phenomena and particle size effects in recording media
10. Surface rouughness and in-plane texturing in sputtered thin films