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Volumn 39, Issue 4-5, 1998, Pages 647-652

Control of crystallographic texture in magnetic thin films for ultra-high density storage media

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNETIC FILM STORAGE; MAGNETIC RECORDING; SURFACE ROUGHNESS; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0032482769     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(98)00209-7     Document Type: Article
Times cited : (9)

References (16)
  • 1
    • 0042758268 scopus 로고    scopus 로고
    • prepared by National Storage Industry Consortium, San Diego, CA
    • Storage Technology Roadmaps, prepared by National Storage Industry Consortium, San Diego, CA (1996).
    • (1996) Storage Technology Roadmaps
  • 15
    • 0042758266 scopus 로고    scopus 로고
    • TSL Inc., private communication October
    • D. Dingeley, TSL Inc., private communication (October 1996).
    • (1996)
    • Dingeley, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.