In situ electrical transport measurements and self-organization in gold nanoparticle films during and after deposition

Surface and Coatings Technology

Volumn 142-144, Issue , 2001, Pages 1088-1093

  Kish, L B ^a,d   Chaoguang, P ^a   Ederth, J ^a   Marlow, W H ^b   Granqvist, C G ^a   Savage, S J ^c  

^a UPPSALA UNIVERSITY   (Sweden)

^b TEXAS A AND M UNIVERSITY   (United States)

^c SWEDISH DEFENCE RESEARCH AGENCY   (Sweden)

^d Department of Electrical and Computer Engineering   (United States)

Author keywords

Aging; Electromigration; Nanoplarticles; Noise; Self organization

Indexed keywords

COATING TECHNIQUES; CONDUCTIVE FILMS; DEPOSITION; ELECTRIC FIELDS; GOLD; PARTICLE SIZE ANALYSIS; PERCOLATION (SOLID STATE);

CONDUCTANCE FLUCTUATIONS; ELECTRICAL TRANSPORT MEASUREMENTS;

NANOSTRUCTURED MATERIALS;

FILM;

EID: 0035386684     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(01)01274-9     Document Type: Article

References (10)

1. Particle size determination