Effect of Ion beam patterning on the write and read performance of perpendicular granular recording media

IEEE Transactions on Magnetics

Volumn 37, Issue 4 I, 2001, Pages 1652-1656

  Lohau, J ^a   Moser, A ^a   Rettner, C T ^a   Best, M E ^a   Terris, B D ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

Focused ion beam; Jitter; Magnetic arrays; Patterned media; Write read performance

Indexed keywords

GRANULAR MATERIALS; ION BEAMS; JITTER; MAGNETIC DOMAINS; MAGNETIC HEADS;

FOCUSED ION BEAMS (FIB); ION BEAM PATTERNING;

MAGNETIC RECORDING;

EID: 0035386373     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.950928     Document Type: Article

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