Scanning magnetoresistance microscopy

Applied Physics Letters

Volumn 69, Issue 21, 1996, Pages 3263-3265

  Yamamoto, S Y ^a   Schultz, S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; IMAGE PROCESSING; INTERFEROMETRY; MAGNETIC FIELDS; MAGNETIC HEADS; MAGNETIC RESONANCE IMAGING; MAGNETORESISTANCE; SENSORS; SIGNAL TO NOISE RATIO; THIN FILMS;

HEAD AND GIMBAL ASSEMBLY; PRECISION BUBBLE TILT SENSORS; RECORD AND PLAYBACK PROCESS; SCANNING MAGNETORESISTANCE MICROSCOPY;

MICROSCOPES;

EID: 0030285708     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118030     Document Type: Article

References (14)

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