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Volumn 142-144, Issue , 2001, Pages 1023-1027

Parametric effects of residual stress in pulsed d.c. plasma enhanced CVD TiN coatings

Author keywords

Adhesion; Plasma enhanced chemical vapor deposition; Residual stress; TiN

Indexed keywords

PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RESIDUAL STRESSES; TITANIUM; X RAY DIFFRACTION;

EID: 0035386086     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(01)01188-4     Document Type: Article
Times cited : (15)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.