SCOPUS 정보 검색 플랫폼

Volumn 6, Issue 3, 2001, Pages 292-299

Spatially modulated illumination microscopy: Online visualization of intensity distribution and prediction of nanometer precision of axial distance measurements by computer simulations

(4) Albrecht, B a Failla, A V a Heintzmann, R a Cremer, C a

a UNIVERSITY OF HEIDELBERG (Germany)

Author keywords

Computer simulations; Hardware control; Object oriented programming; Spatially modulated illumination (SMI) microscopy; Virtual microscopy; Visualization

Indexed keywords

BIOMEDICAL ENGINEERING; COMPUTER SIMULATION; IMAGE PROCESSING; OBJECT ORIENTED PROGRAMMING; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION;

AXIAL DISTANCE MEASUREMENT; FAR FIELD LIGHT MICROSCOPY; SPATIALLY MODULATED ILLUMINATION MICROSCOPY; SPECTRAL PRECISION DISTANCE MICROSCOPY; VIRTUAL MICROSCOPY;

OPTICAL MICROSCOPY;

ARTICLE; COMPUTER INTERFACE; COMPUTER PROGRAM; COMPUTER SIMULATION; FORECASTING; IMAGE PROCESSING; INSTRUMENTATION; LASER; METHODOLOGY; POLARIZATION MICROSCOPY; STANDARD;

COMPUTER SIMULATION; FORECASTING; IMAGE PROCESSING, COMPUTER-ASSISTED; LASERS; MICROSCOPY, POLARIZATION; SOFTWARE; USER-COMPUTER INTERFACE;

EID: 0035384691 PISSN: 10833668 EISSN: None Source Type: Journal
DOI: 10.1117/1.1383293 Document Type: Article

Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.