Electrodeposition of p-WS2 thin film and characterisation

Journal of Crystal Growth

Volumn 226, Issue 1, 2001, Pages 67-72

  Devadasan, J Jebaraj ^a,c   Sanjeeviraja, C ^a   Jayachandran, M ^b  

^a ALAGAPPA UNIVERSITY   (India)

^b CENTRAL ELECTROCHEMICAL RESEARCH INSTITUTE   (India)

^c Pope's College   (India)

Author keywords

A1. Characterization; A3. Electrodeposition; A3.Polycrystalline deposition; B1.WS2; B2. Semiconducting materials; B3. Solar cells

Indexed keywords

COMPUTATIONAL METHODS; CRYSTAL ORIENTATION; ELECTRODEPOSITION; LATTICE CONSTANTS; LIGHT ABSORPTION; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

MOTT-SCHOTTKY THEORY;

SEMICONDUCTING FILMS;

EID: 0035369986     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)00851-X     Document Type: Article

References (16)