Structural analysis of 2H-WS2 thin films by X-ray and TEM investigation

Thin Solid Films

Volumn 311, Issue 1-2, 1997, Pages 146-150

  Ennaoui, A ^a   Diesner, K ^a   Fiechter, S ^a   Moser, J H ^b   Levy F ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b EPFL   (Switzerland)

Author keywords

Growth mechanism; Transmission electron microscopy (TEM); Tungsten oxide; X ray diffraction

Indexed keywords

CHEMICAL REACTIONS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; FILM GROWTH; FILM PREPARATION; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; X RAY CRYSTALLOGRAPHY;

CONVERGENT ELECTRON BEAM DIFFRACTION; CRYSTALLITES; SELECTED AREA DIFFRACTION; SULFURIZATION; TUNGSTEN DISULFIDE;

THIN FILMS;

EID: 0031387018     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00473-2     Document Type: Article

References (25)

1. A. Aruchamy (Ed.), Photoelectrochemistry and Photovoltaic of Layered Semiconductors, Kluwer, Dordrecht, 1992.
2. A. Jäger-Waldau, M.Ch. Lux-Steiner, E. Bucher, Solid State Phenomena 37-38 (1994) 479.
3. J. Lipkowski, P.N. Ross (Eds.), The Electrochemistry of Novel Materials, VCH, Weinheim, 1994.
4. A. Ennaoui, S. Fiechter, K. Ellmer, R. Scheer, K. Diesner, Thin Solid Films 217 (1992) 30.
5. A. Ennaoui, A. Matthäus, S. Fiechter, W. Jaegerman, 13th European Photovoltaic Solar Energy Conference, 1995, p. 1650.
6. G. Prasad, O.N. Srivastava, J. Phys. D 21 (1988) 1028.
7. R. Tenne, A. Wold, Appl. Phys. Lett. 47 (1985) 707.
8. M.K. Agarwal, V.V. Rao, Cryst. Res. Technol. 24 (1989) 1215.
9. R. Späh, U. Elrod, M. Lux-Steiner, M. Obergfell, E. Bucher, S. Wagner, Appl. Phys. Lett. 43 (1983) 79.
10. R. Späh, M. Lux-Steiner, M. Obergfell, E. Bucher, S. Wagner, Appl. Phys. Lett. 47 (1985) 871.
11. M. Vogt, M.Ch. Lux-Steiner, H.-P. Schweikardt, P. Dolatzoglou, M. Keil, W. Reetz, E. Bucher, Prpc. 4th Int. PV Science and Engineering Conf., Sydney, Vol. 1, IREE, Edgecliff NSW, Australia, 1989, p. 493.
12. W.K. Hofmann, J. Mater. Sci. 23 (1988) 3981.
13. G. Chatzitheodorou, S. Fiechter, M. Kunst, J. Luck, H. Tributsch, Mater. Res. Bull. 23 (1988) 1261.
14. R. Bichsel, F. Lévy, Thin Solid Films 116 (1984) 367.
15. V. Buck, Thin Solid Films 139 (1986) 157.
16. P.A. Bertrand, J. Mater. Res. 4 (1989) 180.
17. M. Genut, L. Margulis, R. Tenne, G. Hodes, Thin Solid Films 219 (1992) 30.
18. M. Regula, C. Ballif, J.H. Moser, F. Lévy, Thin Solid Films 280 (1996) 67.
19. E.A. Ponomarev, D. Lahellec, A. Katty, M. Neumann-Spallart, G. Hodes, R. Tenne, C. Levy-Clement, 13th European Photovoltaic Solar Energy Conference, 1995, p. 1601.
20. G. Salitra, G. Hodes, E. Klein, R. Tenne, Thin Solid Films 245 (1994) 180.
21. M. Genut, L. Margulis, G. Hodes, R. Tenne, Thin Solid Films 217 (1992) 91.
22. A. Matthäus, A. Ennaoui, S. Fiechter, T. Kiesewetter, K. Diesner, M. Kunst, I. Sieber, W. Jaegermann, J. Electrochem. Soc. 144 (1997) 1013.
23. E. Jahun, H. Cohen, L. Margulis, M. Hershfinkel, K. Ellmer, W. Jaegermann, G. Hodes, R. Tenne, Appl. Phys. Lett. 67 (1995) 3473.
24. R. Tenne, L. Margulis, M. Genut, G. Hodes, Nature 360 (1992) 444.
25. International Tables for X-ray Crystallography, K. Longsdale (General Ed.), Vol. III. Physical and Chemical Tables, C.H. Macgillavry, G.D. Rieck (Eds.), The Kynoch Press, Birmingham, England, 1968, pp. 157.