Applications of perforated diamond anvils for very high-pressure research

Review of Scientific Instruments

Volumn 72, Issue 6, 2001, Pages 2633-2637

  Dadashev, A ^a   Pasternak, M P ^a   Rozenberg, G Kh ^a   Taylor, R D ^b  

^a TEL AVIV UNIVERSITY   (Israel)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035364715     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1370561     Document Type: Article

References (11)

1. A. Jayaraman, Rev. Mod. Phys. 55, 65 (1983).
2. H. K Mao and R. Hemley, in Reviews of Mineralogy, Vol. 37, edited by R. J. Hemley (Mineralogical Society of America, Washington, DC, 1998), Chap. 1, p. 4.
3. The use of small anvils has a tremendous benefit. The price and the price per carat decrease significantly as the size decreases.
4. W. A. Bassett, A. J. Anderson, R. A. Mayanovic, and I. M. Chou, Chem. Geol. 167, 3 (2000); Z. Kristallogr. 215, 711 (2000).
5. W. A. Bassett, A. J. Anderson, R. A. Mayanovic, and I. M. Chou, Chem. Geol. 167, 3 (2000); Z. Kristallogr. 215, 711 (2000).
6. D'ANVILS is administered by Ramot Ltd., 32 H. Levanon Str., Tel Aviv 61392, ISRAEL. http://www.tau.ac.il/ramot/danvils.
7. For technical reasons truncated conical holes can be drilled down to 50 μm to B1, and the smallest wall thickness D is 0.2 mm [see Figs. 3(a) and 3(b)].
8. G. Yu. Machavariani, M. P. Pasternak, G. R. Hearne, and G. Kh. Rozenberg, Rev. Sci. Instrum. 69, 1423 (1998) TAU-DAC stands for Tel-Aviv University diamond anvil cell.
9. Applying an intermediate hard thin metal foil with a centered hole to protect the DBP in case the MA shatters failed because at high pressures the compressed foil expanded considerably and closed the hole completely.
10. The MA with a 200 μm culet mounted directly on a tungsten-carbide backing plate would not reach a 100 GPa pressure. At this anvil pressure the culet transmits 3 GPa to its 1.2 mm diameter table, indenting the MA into the metal BP.
11. J. Badro, V. V. Struzhkin, J. Shu, R. J. Hemley, H.-K. Mao, C.-C. Kao, J. P. Rueff, and G. Shen, Phys. Rev. Lett. 83, 4101 (1999).