Magnetism in feo at megabar pressures from X-Ray emission spectroscopy

Physical Review Letters

Volumn 83, Issue 20, 1999, Pages 4101-4104

  Badro, James ^a   Struzhkin, Viktor V ^a   Shu, Jinfu ^a   Hemley, Russell J ^a   Mao, Ho Kwang ^a   Kao, Chi Chang ^b   Rueff, Jean Pascal ^b   Shen, Guoyin ^c  

^a GEOPHYSICAL LABORATORY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347964919     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.4101     Document Type: Article

References (23)

1. N. F. Mott, Metal-Insulator Transitions (Taylor and Francis, London, 1990), 2nd ed.
2. D. G. Isaak, R. E. Cohen, M. J. Mehl, and D. J. Singh, Phys. Rev. B, 47, 7720 (1993).
3. R. E. Cohen, I. I. Mazin, and D. G. Isaak, Science, 275, 654 (1997).
4. M. P. Pasternak, R. D. Taylor, R. Jeanloz, X. Li, J. H. Nguyen, and C. A. McCammon, Phys. Rev. Lett., 79, 5046 (1997).
5. I. I. Mazin, Y. Fei, R. Downs, and R. Cohen, Am. Mineral., 83, 451 (1998).
6. Z. Fang, K. Terakura, H. Sawada, T. Miyazaki, and I. Solovyev, Phys. Rev. Lett., 81, 1027 (1998).
7. Z. Fang, I. Solovyev, H. Sawada, and K. Terakura, Phys. Rev. B, 59, 762 (1999).
8. K. Tsutsumi, H. Nakamori, and K. Ichikawa, Phys. Rev. B, 13, 929 (1976).
9. G. Peng, F. M. F. de Groot, K. Hämäläinen, J. A. Moore, X. Wang, M. M. Grush, J. B. Hastings, D. P. Siddons, W. H. Amstrong, O. C. Mullins, and S. P. Cramer, J. Am. Chem. Soc., 116, 2914 (1994).
10. G. Peng, X. Wang, C. R. Randall, J. A. Moore, and S. P. Cramer, Appl. Phys. Lett., 65, 2527 (1994).
11. M. Taguchi, T. Uozumi, and A. Kotani, J. Phys. Soc. Jpn., 66, 247 (1997).
12. J.-P. Rueff, C.-C. Kao, V. V. Struzhkin, J. Badro, J.-F. Shu, R. J. Hemley, and H. K. Mao, Phys. Rev. Lett., 82, 3284 (1999).
13. P. Kirkpatrick and A. V. Baez, J. Opt. Soc. Am., 38, 766 (1948).
14. P. J. Eng, M. Newville, M. L. Rivers, and S. R. Sutton, in X-Ray Microfocusing: Applications and Technique, I. McNult (SPIE International Society of Optical Engineering, Bellingham, VA, 1998), Vol. 3449, p. 145.
15. R. J. Hemley, H. K. Mao, G. Shen, J. Badro, Ph. Gillet, M. Hanfland, and D. Haüsermann, Science, 279, 1242 (1997).
16. Y. Fei and H. K. Mao, Science, 266, 1678 (1994).
17. Y. Syono, A. Ito, S. Morimoto, S. Suzuki, T. Yagi, and S. Akimoto, Solid State Commun., 50, 97 (1984).
18. S. Nasu, K. Kurimoto, S. Nagatomo, S. Endo, and F. Fujita, Hyperfine Interact., 29, 1583 (1986).
19. J.-Z. Hu, et al, (to be published).
20. U. Bergmann, C. R. Horne, T. J. Collins, J. M. Workman, and S. P. Cramer, Chem. Phys. Lett., 302, 119 (1999).
21. G. Zou, H. K. Mao, P. M. Bell, and D. Virgo, Carnegie Inst. Wash. Yearbook, 79, 374 (1980).
22. T. Yagi, T. Suzuki, and S. Akimoto, J. Geophys. Res., 90, 8784 (1985).
23. C. A. McCammon, J. Magn. Magn. Mater., 104, 1937 (1992).