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Volumn 16, Issue 6, 2001, Pages 463-466
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Experimental study of the hot-carrier impact ionization photovoltaic effect in pulsed-CO2-laser-excited silicon junctions
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON DIOXIDE LASERS;
CARRIER CONCENTRATION;
ELECTRIC CURRENTS;
HOT CARRIERS;
IMPACT IONIZATION;
LASER PULSES;
PHOTOVOLTAIC EFFECTS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
ANTIREFLECTION COATINGS;
HOT-CARRIER IMPACT IONIZATION;
SEMICONDUCTOR JUNCTIONS;
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EID: 0035362436
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/16/6/307 Document Type: Article |
Times cited : (4)
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References (18)
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